Re: [PATCH 1/2] pwm: samsung: Fix broken resume after putting per-channel data into driver data

[Sam Protsenko]

On Thu, Nov 9, 2023 at 4:48 AM Marek Szyprowski
<m.szyprowski@xxxxxxxxxxx> wrote:
>
> PWMF_EXPORTED is misleadingly used as a bit numer in the pwm->flags, not
> as a flag value, so the proper test for it must use test_bit() helper.
> This fixes broken resume after putting per-channel data into driver data.
>
> Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data")
> Signed-off-by: Marek Szyprowski <m.szyprowski@xxxxxxxxxxx>
> ---

Reviewed-by: Sam Protsenko <semen.protsenko@xxxxxxxxxx>

>  drivers/pwm/pwm-samsung.c | 2 +-
>  1 file changed, 1 insertion(+), 1 deletion(-)
>
> diff --git a/drivers/pwm/pwm-samsung.c b/drivers/pwm/pwm-samsung.c
> index 568491ed6829..69d9f4577b34 100644
> --- a/drivers/pwm/pwm-samsung.c
> +++ b/drivers/pwm/pwm-samsung.c
> @@ -631,7 +631,7 @@ static int pwm_samsung_resume(struct device *dev)
>                 struct pwm_device *pwm = &chip->pwms[i];
>                 struct samsung_pwm_channel *chan = &our_chip->channel[i];
>
> -               if (!(pwm->flags & PWMF_REQUESTED))
> +               if (!test_bit(PWMF_REQUESTED, &pwm->flags))
>                         continue;
>
>                 if (our_chip->variant.output_mask & BIT(i))
> --
> 2.34.1
>