Re: [PATCH v3 22/27] staging: iio: resolver: ad2s1210: convert LOS threshold to event attr

[Jonathan Cameron]

On Fri, 29 Sep 2023 12:23:27 -0500
David Lechner <dlechner@xxxxxxxxxxxx> wrote:

> From: David Lechner <david@xxxxxxxxxxxxxx>
> 
> From: David Lechner <dlechner@xxxxxxxxxxxx>
> 
> The AD2S1210 has a programmable threshold for the loss of signal (LOS)
> fault. This fault is triggered when either the sine or cosine input
> falls below the threshold voltage.
> 
> This patch converts the custom device LOS threshold attribute to an
> event falling edge threshold attribute on a new monitor signal channel.
> The monitor signal is an internal signal that combines the amplitudes
> of the sine and cosine inputs as well as the current angle and position
> output. This signal is used to detect faults in the input signals.
> 
> The attribute now uses millivolts instead of the raw register value in
> accordance with the IIO ABI.
> 
> Emitting the event will be implemented in a later patch.
> 
> Signed-off-by: David Lechner <dlechner@xxxxxxxxxxxx>

I think I'm fine with treating these internal signals like this, but
I would ideally like someone from Analog devices to take a look at how
these are being done and make sure our interpretations of the signals
make sense to them.  We are pushing the boundaries a little here (though
we have done similar before for fault events I think.)

Jonathan