[PATCH v3] selftests/input: introduce a test for the EVIOCGKEY ioctl

[Dana Elfassy]

This patch introduces a specific test case for the EVIOCGKEY ioctl.
The test covers the case where len > maxlen in the
EVIOCGKEY(sizeof(keystate)), keystate) ioctl.

Signed-off-by: Dana Elfassy <dangel101@xxxxxxxxx>
---
Changes in v3:
- Edited commit's subject and description
- Renamed variable rep_values to keystate
- Added argument to selftest_uinput_create_device()
- Removed memset

Changes in v2:
- Added following note about the patch's dependency

This patch depends on '[v3] selftests/input: Introduce basic tests for evdev ioctls' [1] sent to the ML.
[1] https://patchwork.kernel.org/project/linux-input/patch/20230607153214.15933-1-eballetbo@xxxxxxxxxx/
 tools/testing/selftests/input/evioc-test.c | 17 +++++++++++++++++
 1 file changed, 17 insertions(+)

diff --git a/tools/testing/selftests/input/evioc-test.c b/tools/testing/selftests/input/evioc-test.c
index ad7b93fe39cf..e0f69459f504 100644
--- a/tools/testing/selftests/input/evioc-test.c
+++ b/tools/testing/selftests/input/evioc-test.c
@@ -234,4 +234,21 @@ TEST(eviocsrep_set_repeat_settings)
 	selftest_uinput_destroy(uidev);
 }
 
+TEST(eviocgkey_get_global_key_state)
+{
+	struct selftest_uinput *uidev;
+	int keystate = 0;
+	int rc;
+
+	rc = selftest_uinput_create_device(&uidev, -1);
+	ASSERT_EQ(0, rc);
+	ASSERT_NE(NULL, uidev);
+
+	/* ioctl to create the scenario where len > maxlen in bits_to_user() */
+	rc = ioctl(uidev->evdev_fd, EVIOCGKEY(0), keystate);
+	ASSERT_EQ(0, rc);
+
+	selftest_uinput_destroy(uidev);
+}
+
 TEST_HARNESS_MAIN
-- 
2.41.0