Re: [PATCH v10 3/5] hisi_acc_vfio_pci: register debugfs for hisilicon migration driver

From: liulongfang
Date: Fri Jun 02 2023 - 03:07:58 EST


On 2023/5/16 19:50, Jason Gunthorpe wrote:
> On Tue, May 16, 2023 at 05:40:36PM +0800, liulongfang wrote:
>> On 2023/4/21 22:31, Jason Gunthorpe wrote:
>>> On Fri, Apr 21, 2023 at 11:32:47AM +0800, liulongfang wrote:
>>>
>>>> Thank you for your suggestion, but the current debugfs method can already
>>>> meet the functional requirements of verification testing and
>>>> problem location.
>>>
>>> To be clear, I'm against adding selftest code in this manner. We have
>>> many frameworks for kernel teesting, please pick one and integrate
>>> with it.
>>>
>>
>> Hi, Jason:
>> The purpose of this hisi_acc_vf_debug_restore function is to obtain the
>> migration status data of the migration device. It is a debug operation.
>> Just to obtain this status data, user need to complete the few steps
>> of live migration.
>> Therefore, it is a debug function here, not a self-test function.
>
> A debug function should not alter the device state, or do a trial migration.
>

OK Then I delete this migration and restore the test operation.
Does this meet your requirements?

Thanks,
Longfang.
> Jason
> .
>