Re: [PATCH 4/5] selftests: firmware: Simplify test patterns

[Shuah Khan]

On 4/21/22 9:29 AM, Takashi Iwai wrote:
> The test patterns are almost same in three sequential tests.
> Make the unified helper function for improving the readability.
>
> Link: https://lore.kernel.org/all/20210127154939.13288-1-tiwai@xxxxxxx/
> Signed-off-by: Takashi Iwai <tiwai@xxxxxxx>
> ---

Thank you. It helps with maintaining this code easier.

Reviewed-by: Shuah Khan <skhan@xxxxxxxxxxxxxxxxxxx>

thanks,
-- Shuah