[PATCH 3/5] tools/testing/nvdimm: support nfit_test_dimm attributes under nfit_test.1

From: Dan Williams
Date: Tue Apr 10 2018 - 18:49:29 EST


The nfit_test.1 bus provides a pmem topology without blk-aperture
enabling, so it presents different failure modes for label space
handling. Allow custom DSM command error injection.

Signed-off-by: Dan Williams <dan.j.williams@xxxxxxxxx>
---
tools/testing/nvdimm/test/nfit.c | 43 ++++++++++++++++++++++----------------
1 file changed, 25 insertions(+), 18 deletions(-)

diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index dc6cf5630280..c8c88363311b 100644
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -1166,12 +1166,12 @@ static int ars_state_init(struct device *dev, struct ars_state *ars_state)

static void put_dimms(void *data)
{
- struct device **dimm_dev = data;
+ struct nfit_test *t = data;
int i;

- for (i = 0; i < NUM_DCR; i++)
- if (dimm_dev[i])
- device_unregister(dimm_dev[i]);
+ for (i = 0; i < t->num_dcr; i++)
+ if (t->dimm_dev[i])
+ device_unregister(t->dimm_dev[i]);
}

static struct class *nfit_test_dimm;
@@ -1180,13 +1180,11 @@ static int dimm_name_to_id(struct device *dev)
{
int dimm;

- if (sscanf(dev_name(dev), "test_dimm%d", &dimm) != 1
- || dimm >= NUM_DCR || dimm < 0)
+ if (sscanf(dev_name(dev), "test_dimm%d", &dimm) != 1)
return -ENXIO;
return dimm;
}

-
static ssize_t handle_show(struct device *dev, struct device_attribute *attr,
char *buf)
{
@@ -1259,7 +1257,6 @@ static ssize_t fail_cmd_code_store(struct device *dev, struct device_attribute *
}
static DEVICE_ATTR_RW(fail_cmd_code);

-
static struct attribute *nfit_test_dimm_attributes[] = {
&dev_attr_fail_cmd.attr,
&dev_attr_fail_cmd_code.attr,
@@ -1276,6 +1273,23 @@ static const struct attribute_group *nfit_test_dimm_attribute_groups[] = {
NULL,
};

+static int nfit_test_dimm_init(struct nfit_test *t)
+{
+ int i;
+
+ if (devm_add_action_or_reset(&t->pdev.dev, put_dimms, t))
+ return -ENOMEM;
+ for (i = 0; i < t->num_dcr; i++) {
+ t->dimm_dev[i] = device_create_with_groups(nfit_test_dimm,
+ &t->pdev.dev, 0, NULL,
+ nfit_test_dimm_attribute_groups,
+ "test_dimm%d", i + t->dcr_idx);
+ if (!t->dimm_dev[i])
+ return -ENOMEM;
+ }
+ return 0;
+}
+
static void smart_init(struct nfit_test *t)
{
int i;
@@ -1371,17 +1385,8 @@ static int nfit_test0_alloc(struct nfit_test *t)
if (!t->_fit)
return -ENOMEM;

- if (devm_add_action_or_reset(&t->pdev.dev, put_dimms, t->dimm_dev))
+ if (nfit_test_dimm_init(t))
return -ENOMEM;
- for (i = 0; i < NUM_DCR; i++) {
- t->dimm_dev[i] = device_create_with_groups(nfit_test_dimm,
- &t->pdev.dev, 0, NULL,
- nfit_test_dimm_attribute_groups,
- "test_dimm%d", i);
- if (!t->dimm_dev[i])
- return -ENOMEM;
- }
-
smart_init(t);
return ars_state_init(&t->pdev.dev, &t->ars_state);
}
@@ -1413,6 +1418,8 @@ static int nfit_test1_alloc(struct nfit_test *t)
if (!t->spa_set[1])
return -ENOMEM;

+ if (nfit_test_dimm_init(t))
+ return -ENOMEM;
smart_init(t);
return ars_state_init(&t->pdev.dev, &t->ars_state);
}